Time-Resolved Z-Scan Measurements Of Optical Nonlinearities
Abbreviated Journal Title
J. Opt. Soc. Am. B-Opt. Phys.
SINGLE-BEAM; SEMICONDUCTORS; REFRACTION; DISPERSION; Optics
We introduce a temporal delay in one beam of the two-color Z-scan apparatus, which measures nondegenerate nonlinear absorption and nondegenerate nonlinear refraction. This technique allows us to time resolve separately the sign and the magnitude of the nonlinear absorption and refraction at frequency omega(p) that are due to the presence of a strong excitation at frequency omega(e). For example, in semiconductors we specifically measure the bound electronic, nondegenerate nonlinear refraction and nondegenerate two-photon absorption, as well as the two-photon-generated free-carrier refraction and absorption as functions of time. We demonstrate this technique on ZnSe, ZnS, and CS2, using picosecond pulses at 1.06 and 0.532 mum.
Journal of the Optical Society of America B-Optical Physics
"Time-Resolved Z-Scan Measurements Of Optical Nonlinearities" (1994). Faculty Bibliography 1990s. 2983.