Title
Electrical Network Model For Sprite Detectors
Abbreviated Journal Title
Opt. Eng.
Keywords
INFRARED IMAGING SYSTEMS; DETECTORS; SIGNAL PROCESSING; MODULATION TRANSFER-FUNCTION; MTF; Optics
Abstract
Impedance measurements were made on SPRITE (signal processing in the element) detectors. The resistive contributions were found to contain a contact resistance term, along with a term proportional to the semiconductor material length between terminals. The capacitive contributions were strongly frequency dependent and were largely independent of material length. This behavior would appear to be caused by nonohmic contacts at the metal-semiconductor interfaces where the SPRITE is bonded to its external electrical connections. When the SPRITEs were illuminated, the resistance decreased as expected, but the capacitance showed a sizable increase as well. A T-network model is developed that is consistent with the set of two-terminal impedance measurements. A model of this type should provide a useful starting point for electronics optimizations in SPRITE systems, including the design of the bias source, the readout mechanism, and the preamplifier.
Journal Title
Optical Engineering
Volume
30
Issue/Number
11
Publication Date
1-1-1991
Document Type
Article
DOI Link
Language
English
First Page
1784
Last Page
1787
WOS Identifier
ISSN
0091-3286
Recommended Citation
"Electrical Network Model For Sprite Detectors" (1991). Faculty Bibliography 1990s. 372.
https://stars.library.ucf.edu/facultybib1990/372
Comments
Authors: contact us about adding a copy of your work at STARS@ucf.edu