Title
An improved electrostatic discharge protection structure for reducing triggering voltage and parasitic capacitance
Abbreviated Journal Title
Solid-State Electron.
Keywords
ESD PROTECTION; WELL; Engineering, Electrical & Electronic; Physics, Applied; Physics, ; Condensed Matter
Abstract
On-chip electrostatic discharge (ESD) protection structures are frequently used in microchips to protect the core circuit again ESD damages. Relatively large parasitic capacitances associated with these structures, however, can degrade the performance of microchips. In this paper, a new type of supply clamp is studied for the purpose of reducing the parasitic capacitance in ESD protection structures. The approach and physics of the new supply clamp are discussed, and both experimental data and device simulation are provided in support of the investigation. (C) 2003 Elsevier Science Ltd. All rights reserved.
Journal Title
Solid-State Electronics
Volume
47
Issue/Number
6
Publication Date
1-1-2003
Document Type
Article
Language
English
First Page
1105
Last Page
1110
WOS Identifier
ISSN
0038-1101
Recommended Citation
"An improved electrostatic discharge protection structure for reducing triggering voltage and parasitic capacitance" (2003). Faculty Bibliography 2000s. 3769.
https://stars.library.ucf.edu/facultybib2000/3769