Abbreviated Journal Title
J. Vac. Sci. Technol. B
FORCE MICROSCOPY; LOCALIZED CHARGE; Engineering, Electrical & Electronic; Nanoscience & Nanotechnology; Physics, Applied
Surface charge on insulating samples can be a significant source of error for scanning probe microscopes. We have found that it is possible to operate a scanning force microscope in a manner that makes it relatively immune to charge-induced forces while still allowing the probe tip to nondestructively follow the surface topography. The need to maintain close charge balance on the sample is thus obviated. We have used this strategy to perform critical dimension measurements on optical photomasks with the Surface/Interface Stylus NanoProfilometer. This instrument incorporates a servoed force-balance sensor. Surface topography is determined by touching the surface with contact forces between 0.1 and 1 muN. (C) 2000 American Vacuum Society. [S0734-211X(00)01706-6].
Journal of Vacuum Science & Technology B
Article; Proceedings Paper
Griffith, J. E.; Kneedler, E. M.; Ningen, S.; Berghaus, A.; Bryson, C. E. III; Pau, S.; Houge, E.; and Shofner, T., "Scanning probe metrology in the presence of surface charge" (2000). Faculty Bibliography 2000s. 7904.