Authors

M. Moller; A. M. Sayler; T. Rathje; M. Chini; Z. H. Chang;G. G. Paulus

Comments

Authors: contact us about adding a copy of your work at STARS@ucf.edu

"This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in the linked citation and may be found originally at Applied Physics Letters."

Abbreviated Journal Title

Appl. Phys. Lett.

Keywords

ABOVE-THRESHOLD IONIZATION; CYCLE LASER-PULSES; FIELDS; Physics, Applied

Abstract

Polarization gating is used to extend a real-time, single-shot, carrier-envelope phase (CEP) measurement, based on high-energy above-threshold ionization in xenon, to the multi-cycle regime. The single-shot CEP precisions achieved are better than 175 and 350 mrad for pulse durations up to 10 fs and 12.5 fs, respectively, while only 130 mu J of pulse energy are required. This opens the door to study and control of CEP-dependent phenomena in ultra-intense laser-matter interaction using optical parametric chirped pulse amplifier based tera- and petawatt class lasers.

Journal Title

Applied Physics Letters

Volume

99

Issue/Number

12

Publication Date

1-1-2011

Document Type

Article

Language

English

First Page

3

WOS Identifier

WOS:000295853500008

ISSN

0003-6951

Download

Share

COinS