Experimental Verification of RF Stress Effect on Cascode Class-E PA Performance and Reliability
Abbreviated Journal Title
IEEE Trans. Device Mater. Reliab.
Cascode class E; gate oxide breakdown; output power; power amplifier; (PA); power efficiency; reliability; POWER-AMPLIFIER; HOT-CARRIER; OXIDE BREAKDOWN; EFFICIENCY; OPERATION; IMPACT; MODEL; SOFT; Engineering, Electrical & Electronic; Physics, Applied
A cascode class-E power amplifier (PA) operating at 5.2 GHz has been designed using Advanced Design System simulation. RF circuit performances such as output power and power-added efficiency before and after RF stress have been experimentally investigated. The measured output power, power-added efficiency, and linearity after high-input-power RF stress at elevated supply voltage show significant circuit degradations. The impact of hot-carrier injection and gate oxide soft breakdown on cascode class-E PA reliability is discussed.
Ieee Transactions on Device and Materials Reliability
"Experimental Verification of RF Stress Effect on Cascode Class-E PA Performance and Reliability" (2012). Faculty Bibliography 2010s. 3543.