Title

Intrinsic detection of scattering phase with near-field scanning optical microscope

Authors

Authors

D. C. Kohlgraf-Owens; D. Haefner; S. Sukhov;A. Dogariu

Comments

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Abbreviated Journal Title

Opt. Lett.

Keywords

CONTRAST; PROBES; Optics

Abstract

We show that the interferometric interaction between the tip and the sample is inherently measured by a near-field scanning optical microscope (NSOM) operating in reflection mode. This is demonstrated by measuring the phase of the sample reflectivity on a standard multilayer system with variable thickness. The demonstrated intrinsic sensitivity to the phase has implications in the interpretation of images collected by using reflection mode NSOM. (C) 2010 Optical Society of America

Journal Title

Optics Letters

Volume

35

Issue/Number

14

Publication Date

1-1-2010

Document Type

Article

Language

English

First Page

2463

Last Page

2465

WOS Identifier

WOS:000279994400050

ISSN

0146-9592

Recommended Citation

"Intrinsic detection of scattering phase with near-field scanning optical microscope" (2010). Faculty Bibliography 2010s. 375.
https://stars.library.ucf.edu/facultybib2010/375