Multi-frequency near-field scanning optical microscopy
Abbreviated Journal Title
optical force; near-field scanning optical microscopy; opto-mechanics; scanning probe microscopy; atomic force microscopy; PROBE MICROSCOPY; FORCE MICROSCOPY; TUNING FORK; Nanoscience & Nanotechnology; Materials Science, Multidisciplinary; Physics, Applied
We demonstrate a new multi-frequency approach for mapping near-field optically induced forces with subwavelength spatial resolution. The concept relies on oscillating a scanning probe at two different frequencies. Oscillations at one frequency are driven electrically to provide positional feedback regulation. Modulations at another frequency are induced optically and are used to measure the mechanical action of the optical field on the probe. Because the measurement is based on locally detecting the force of the electromagnetic radiation acting on the probe, the new method does not require a photodetector to map the radiation distribution and, therefore, can provide true broadband detection of light with a single probe.
"Multi-frequency near-field scanning optical microscopy" (2014). Faculty Bibliography 2010s. 5581.