Abstract
Methods, systems, apparatus and devices for using a modified PDH technique to measure the FSR of an etalon with one part per l0^4 precision. This method is especially useful for etalons with small FSR (less than 10 GHz) because this method does not require a high resolution OSA or tuneable laser. As the ITU grid for DWDM becomes denser, this method will have a larger impact on the FSR measurement of etalons.
Document Type
Patent
Patent Number
US 7,800,763
Application Serial Number
11/762,404
Issue Date
9-21-2010
Current Assignee
UCFRF
Assignee at Issuance
UCFRF
College
College of Optics and Photonics
Department
CREOL
Filing Date
6-13-2007
Assignee at Filing
UCFRF
Filing Type
Nonprovisional Application Record
Donated
no
Recommended Citation
Delfyett, Peter; Gee, Sangyoun; Ozharar, Sarper; and Quinlan, Franklyn, "High Precision Measurement of the Free Spectral Range of an Etalon" (2010). UCF Patents. 237.
https://stars.library.ucf.edu/patents/237