Abstract
An easy and controllable method and system to attach a carbon nanotube to a scanning probe tip such as a scanning probe microscopy (SPM) tip using a focus ion beam (FIB) technique. The method and system includes selecting a carbon fiber by a Focus Ion Beam micromanipulator, picking up the carbon fiber with the nanotube tip, forming a slot on an SPM tip, and inserting the carbon fiber with the nanotube tip into the slot.
Document Type
Patent
Patent Number
US 7,847,207
Application Serial Number
10/961,929
Issue Date
12-7-2010
Current Assignee
UCFRF
Assignee at Issuance
UCFRF
College
College of Sciences
Department
Physics
Allowance Date
8-19-2010
Filing Date
10-8-2004
Assignee at Filing
UCFRF
Filing Type
Nonprovisional Application Record
Donated
no
Recommended Citation
Chow, Lee and Chai, Guang, "Method and System to Attach Carbon Nanotube Probe to Scanning Probe Microscopy Tips" (2010). UCF Patents. 331.
https://stars.library.ucf.edu/patents/331