A two-port device can be described by the incident and reflected voltages at each port. The parameters used in this description are known as scattering parameters. Accurate measurement of the values are thus important in device evaluation and network design. Limitations arise with the measurement capability of the equipment. In order to reduce these limitations, the data acquisition is controlled remotely by a computer program. The program also offers an error correction analysis of the measurement results. The measurement setup and basic approach are discussed as well as the techniques of normalization and calibration of each scattering parameter. The computer program offers three methods of data acquisition which are presented in detail. Results of device testing and error analysis are presented.
Master of Science (M.S.)
College of Engineering
Length of Campus-only Access
Doctoral Dissertation (Open Access)
Douglas, Sallie Layton, "Remote Data Acquisition and Error Analysis of the Scattering Parameters of Quartz Crystal Devices" (1987). Retrospective Theses and Dissertations. 5085.