Nonlinear Optical Characterization Of Cdte As Applied To Limiting At 1.06 Μm
The authors have conducted a detailed characterization of the II-VI compound semiconductor CdTe, which is a two-photon absorber at the fundamental Nd:YAG laser wavelength, 1.06 μm. They report measurements of the 2PA coefficient (22 cm/GW) along with the free carrier nonlinear refraction. They have also developed an experimental technique, called a z-scan, which involves scanning a nonlinear sample along the beam axis direction through the focal position of a tighly focused Gaussian beam and observing the transmitted energy through a pinhole. This allows them to distinguish between positive (self-focusing) and negative (self-defocusing) refractive nonlinearities as well as between refractive and absorptive nonlinearities. They used this technique to measure induced phase changes of λ/30 in several materials. On the basis of their results the authors have designed and constructed a self-protecting optical limiter from CdTe. This device limits at energies in the 10-20 nJ range at 1.06 μm and should operate uniformly between 1.55 and 0.95 μm.
CONFERENCE ON LASERS AND ELECTRO-0PTICS
Article; Proceedings Paper
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Hagan, D. J.; Young, J.; and Sheik-Bahae, M., "Nonlinear Optical Characterization Of Cdte As Applied To Limiting At 1.06 Μm" (1989). Scopus Export 1980s. 388.