Title

High Conversion Efficiency Mass-Limited Laser Plasma Source For Euv Lithography

Abstract

EUV lithography requires a high-efficiency light source at 13nm that is free from debris. Our mass-limited tin material laser plasma source provides the highest conversion of laser-light to useful in-band EUV emission.

Publication Date

1-1-2003

Publication Title

OSA Trends in Optics and Photonics Series

Volume

88

Number of Pages

1988-1991

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

Socpus ID

8744307263 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/8744307263

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