Femtosecond X-Ray Diffraction Of Short-Pulse Irradiated Semiconductors
Ultrafast optical-pump, x-ray diffraction probe experiments are providing new ways to study transient processes in physics, chemistry, and biology. In addition, the direct observation of the atomic motion by which many solid-state processes and chemical and biochemical reaction take place is included as well. As such, current table-top-terawatt femtosecond laser systems provide an attractive source of few-hundred femtosecond duration bursts of angstrom-scale x-ray radiation with fluxes comparable to standard rotating-anode sources.
Conference on Quantum Electronics and Laser Science (QELS) - Technical Digest Series
Number of Pages
Article; Proceedings Paper
Source API URL
Siders, Craig W.; Cavalleri, A.; and Tóth, Cs, "Femtosecond X-Ray Diffraction Of Short-Pulse Irradiated Semiconductors" (2002). Scopus Export 2000s. 2944.