High-quality La3Ga5.5Ta0.5O14 and La3Ga5.5Nb0.5O14 LPE films for oscillators and resonators
Abbreviated Journal Title
J. Cryst. Growth
surface structure; liquid phase epitaxy; oxides; rare earth compounds; piezoelectric materials; LIQUID-PHASE EPITAXY; LANGASITE; GROWTH; Crystallography; Materials Science, Multidisciplinary; Physics, Applied
Single-crystalline La3Ga5.5Ta0.5O14 and La3Ga5.5Nb0.5O14 films were grown by liquid phase epitaxy (LPE) for the first time. Crack-free thin films up to 1.5 x 1.5 cm(2) were obtained from a PbO-based flux on X-, Y-, and Z-oriented substrates, by homoepitaxy. Characterization was done by AFM, SEM/EDAX, XRD and optical microscopy. The morphology of X- and Y-oriented LGT films show a similar growth habit as previously found for LGS LPE films. X-LGT films are extremely flat over macroscopic dimensions. On Y-oriented films, (macro)steps and facets are formed, and growth hillocks and spirals were observed on Z-oriented LGN films. (C) 2002 Elsevier Science B.V. All rights reserved.
Journal of Crystal Growth
Article; Proceedings Paper
"High-quality La3Ga5.5Ta0.5O14 and La3Ga5.5Nb0.5O14 LPE films for oscillators and resonators" (2003). Faculty Bibliography 2000s. 3865.