Title

Time-Resolved Z-Scan Measurements Of Optical Nonlinearities

Authors

Authors

J. Wang; M. Sheikbahae; A. A. Said; D. J. Hagan;E. W. Vanstryland

Comments

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Abbreviated Journal Title

J. Opt. Soc. Am. B-Opt. Phys.

Keywords

SINGLE-BEAM; SEMICONDUCTORS; REFRACTION; DISPERSION; Optics

Abstract

We introduce a temporal delay in one beam of the two-color Z-scan apparatus, which measures nondegenerate nonlinear absorption and nondegenerate nonlinear refraction. This technique allows us to time resolve separately the sign and the magnitude of the nonlinear absorption and refraction at frequency omega(p) that are due to the presence of a strong excitation at frequency omega(e). For example, in semiconductors we specifically measure the bound electronic, nondegenerate nonlinear refraction and nondegenerate two-photon absorption, as well as the two-photon-generated free-carrier refraction and absorption as functions of time. We demonstrate this technique on ZnSe, ZnS, and CS2, using picosecond pulses at 1.06 and 0.532 mum.

Journal Title

Journal of the Optical Society of America B-Optical Physics

Volume

11

Issue/Number

6

Publication Date

1-1-1994

Document Type

Article

Language

English

First Page

1009

Last Page

1017

WOS Identifier

WOS:A1994NR12600007

ISSN

0740-3224

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