Title
Time-Resolved Z-Scan Measurements Of Optical Nonlinearities
Abbreviated Journal Title
J. Opt. Soc. Am. B-Opt. Phys.
Keywords
SINGLE-BEAM; SEMICONDUCTORS; REFRACTION; DISPERSION; Optics
Abstract
We introduce a temporal delay in one beam of the two-color Z-scan apparatus, which measures nondegenerate nonlinear absorption and nondegenerate nonlinear refraction. This technique allows us to time resolve separately the sign and the magnitude of the nonlinear absorption and refraction at frequency omega(p) that are due to the presence of a strong excitation at frequency omega(e). For example, in semiconductors we specifically measure the bound electronic, nondegenerate nonlinear refraction and nondegenerate two-photon absorption, as well as the two-photon-generated free-carrier refraction and absorption as functions of time. We demonstrate this technique on ZnSe, ZnS, and CS2, using picosecond pulses at 1.06 and 0.532 mum.
Journal Title
Journal of the Optical Society of America B-Optical Physics
Volume
11
Issue/Number
6
Publication Date
1-1-1994
Document Type
Article
Language
English
First Page
1009
Last Page
1017
WOS Identifier
ISSN
0740-3224
Recommended Citation
"Time-Resolved Z-Scan Measurements Of Optical Nonlinearities" (1994). Faculty Bibliography 1990s. 2983.
https://stars.library.ucf.edu/facultybib1990/2983
Comments
Authors: contact us about adding a copy of your work at STARS@ucf.edu