Time-Resolved Z-Scan Measurements Of Optical Nonlinearities

    Authors

    J. Wang; M. Sheikbahae; A. A. Said; D. J. Hagan;E. W. Vanstryland

    Comments

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    Abbreviated Journal Title

    J. Opt. Soc. Am. B-Opt. Phys.

    Keywords

    SINGLE-BEAM; SEMICONDUCTORS; REFRACTION; DISPERSION; Optics

    Abstract

    We introduce a temporal delay in one beam of the two-color Z-scan apparatus, which measures nondegenerate nonlinear absorption and nondegenerate nonlinear refraction. This technique allows us to time resolve separately the sign and the magnitude of the nonlinear absorption and refraction at frequency omega(p) that are due to the presence of a strong excitation at frequency omega(e). For example, in semiconductors we specifically measure the bound electronic, nondegenerate nonlinear refraction and nondegenerate two-photon absorption, as well as the two-photon-generated free-carrier refraction and absorption as functions of time. We demonstrate this technique on ZnSe, ZnS, and CS2, using picosecond pulses at 1.06 and 0.532 mum.

    Journal Title

    Journal of the Optical Society of America B-Optical Physics

    Volume

    11

    Issue/Number

    6

    Publication Date

    1-1-1994

    Document Type

    Article

    Language

    English

    First Page

    1009

    Last Page

    1017

    WOS Identifier

    WOS:A1994NR12600007

    ISSN

    0740-3224

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