Measuring Nonlinear Refraction and Its Dispersion
We describe methods for measuring the nonlinear refraction of nominally transparent materials that involve propagation from the near to the far Field, which changes a phase distortion into an amplitude redistribution. These methods include beam distortion methods and Z-scan. We also look at methods to determine the spectral dependence of these changes in refractive index. Recent advances here include using femtosecond white-light continua as the source for Z-scan. The types of nonlinear refractive mechanisms are also briefly discussed including bound-electronic, excited state or free-carrier generation, reorientation, electrostrictive, and thermal nonlinear refraction as well as cascaded second-order nonlinearities.
Self-focusing: Past and Present
"Measuring Nonlinear Refraction and Its Dispersion" (2009). Faculty Bibliography 2000s. 2254.