Title

Measuring Nonlinear Refraction and Its Dispersion

Authors

Authors

E. W. Van Stryland;D. J. Hagan

Comments

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Abstract

We describe methods for measuring the nonlinear refraction of nominally transparent materials that involve propagation from the near to the far Field, which changes a phase distortion into an amplitude redistribution. These methods include beam distortion methods and Z-scan. We also look at methods to determine the spectral dependence of these changes in refractive index. Recent advances here include using femtosecond white-light continua as the source for Z-scan. The types of nonlinear refractive mechanisms are also briefly discussed including bound-electronic, excited state or free-carrier generation, reorientation, electrostrictive, and thermal nonlinear refraction as well as cascaded second-order nonlinearities.

Journal Title

Self-focusing: Past and Present

Volume

114

Publication Date

1-1-2009

Document Type

Article

First Page

573

Last Page

591

WOS Identifier

WOS:000262468700028

ISSN

0303-4216; 978-0-387-32147-9

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