Measuring Nonlinear Refraction and Its Dispersion

    Authors

    E. W. Van Stryland;D. J. Hagan

    Comments

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    Abstract

    We describe methods for measuring the nonlinear refraction of nominally transparent materials that involve propagation from the near to the far Field, which changes a phase distortion into an amplitude redistribution. These methods include beam distortion methods and Z-scan. We also look at methods to determine the spectral dependence of these changes in refractive index. Recent advances here include using femtosecond white-light continua as the source for Z-scan. The types of nonlinear refractive mechanisms are also briefly discussed including bound-electronic, excited state or free-carrier generation, reorientation, electrostrictive, and thermal nonlinear refraction as well as cascaded second-order nonlinearities.

    Journal Title

    Self-focusing: Past and Present

    Volume

    114

    Publication Date

    1-1-2009

    Document Type

    Article

    First Page

    573

    Last Page

    591

    WOS Identifier

    WOS:000262468700028

    ISSN

    0303-4216; 978-0-387-32147-9

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