Hot-carrier and soft-breakdown effects on VCO performance
Abbreviated Journal Title
IEEE Trans. Microw. Theory Tech.
circuit reliability; dielectric breakdown; hot carriers; MOSFETs; phase-locked loops; phase noise; timing jitter; voltage-controlled; oscillators (VCOs); Engineering, Electrical & Electronic
This paper systematically investigates the hot-carrier- and soft-breakdown-induced performance degradation in A CMOS voltage-controlled oscillator (VCO) used in phase-locked-loop frequency synthesizers. After deriving the closed-form equations to predict phase noise and VCO gain, we rem late VCO RF performance such as phase noise, tuning range, and gain of VCO subject to electrical stress. The circuit degradations predicted by analytical model equations are verified by SpectraRF simulation using parameters extracted from the experimental data of 0.16-mum CMOS. technology. BERT simulation results give VCO performance degradations versus operation time.
Ieee Transactions on Microwave Theory and Techniques
Article; Proceedings Paper
"Hot-carrier and soft-breakdown effects on VCO performance" (2002). Faculty Bibliography 2000s. 3557.