Title

Hot-carrier and soft-breakdown effects on VCO performance

Authors

Authors

E. J. Xiao; J. S. Yuan;H. Yang

Comments

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Abbreviated Journal Title

IEEE Trans. Microw. Theory Tech.

Keywords

circuit reliability; dielectric breakdown; hot carriers; MOSFETs; phase-locked loops; phase noise; timing jitter; voltage-controlled; oscillators (VCOs); Engineering, Electrical & Electronic

Abstract

This paper systematically investigates the hot-carrier- and soft-breakdown-induced performance degradation in A CMOS voltage-controlled oscillator (VCO) used in phase-locked-loop frequency synthesizers. After deriving the closed-form equations to predict phase noise and VCO gain, we rem late VCO RF performance such as phase noise, tuning range, and gain of VCO subject to electrical stress. The circuit degradations predicted by analytical model equations are verified by SpectraRF simulation using parameters extracted from the experimental data of 0.16-mum CMOS. technology. BERT simulation results give VCO performance degradations versus operation time.

Journal Title

Ieee Transactions on Microwave Theory and Techniques

Volume

50

Issue/Number

11

Publication Date

1-1-2002

Document Type

Article; Proceedings Paper

Language

English

First Page

2453

Last Page

2458

WOS Identifier

WOS:000178986000005

ISSN

0018-9480

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