Reflective infrared ellipsometry of plastic films
Abbreviated Journal Title
Int. J. Infrared Millimeter Waves
infrared ellipsometry; FTIR; optical constants; plastics; polymer; frequency selective surface; Engineering, Electrical & Electronic; Optics; Physics, Applied
High resolution reflective ellipsometry is used to study freely suspended plastic films. We determine room temperature optical constants in the infrared for a variety of plastics using ellipsometry. The films are typically 6 to 100 mu m thick and measurements are performed from near infrared to long wave-IR. The setup includes modeling software to fit the ellipsometric data to a generalized oscillator model. The films studied include acrylics, fluoropolymers, and variations,of polyethylene, polystyrene, and polyvinyl chloride (PVC) among others. We are able to determine in-plane and out-of-plane optical constants. Transmission spectra from FTIR measurements are plotted and compared with ellipsometry results.
International Journal of Infrared and Millimeter Waves
"Reflective infrared ellipsometry of plastic films" (2006). Faculty Bibliography 2000s. 6134.