Title

Reflective infrared ellipsometry of plastic films

Authors

Authors

W. R. Folks; S. K. Pandey; G. Pribil; D. Slafer; M. Manning;G. Boreman

Comments

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Abbreviated Journal Title

Int. J. Infrared Millimeter Waves

Keywords

infrared ellipsometry; FTIR; optical constants; plastics; polymer; frequency selective surface; Engineering, Electrical & Electronic; Optics; Physics, Applied

Abstract

High resolution reflective ellipsometry is used to study freely suspended plastic films. We determine room temperature optical constants in the infrared for a variety of plastics using ellipsometry. The films are typically 6 to 100 mu m thick and measurements are performed from near infrared to long wave-IR. The setup includes modeling software to fit the ellipsometric data to a generalized oscillator model. The films studied include acrylics, fluoropolymers, and variations,of polyethylene, polystyrene, and polyvinyl chloride (PVC) among others. We are able to determine in-plane and out-of-plane optical constants. Transmission spectra from FTIR measurements are plotted and compared with ellipsometry results.

Journal Title

International Journal of Infrared and Millimeter Waves

Volume

27

Issue/Number

11

Publication Date

1-1-2006

Document Type

Article

Language

English

First Page

1553

Last Page

1571

WOS Identifier

WOS:000243227200010

ISSN

0195-9271

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