Reflective infrared ellipsometry of plastic films

    Authors

    W. R. Folks; S. K. Pandey; G. Pribil; D. Slafer; M. Manning;G. Boreman

    Comments

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    Abbreviated Journal Title

    Int. J. Infrared Millimeter Waves

    Keywords

    infrared ellipsometry; FTIR; optical constants; plastics; polymer; frequency selective surface; Engineering, Electrical & Electronic; Optics; Physics, Applied

    Abstract

    High resolution reflective ellipsometry is used to study freely suspended plastic films. We determine room temperature optical constants in the infrared for a variety of plastics using ellipsometry. The films are typically 6 to 100 mu m thick and measurements are performed from near infrared to long wave-IR. The setup includes modeling software to fit the ellipsometric data to a generalized oscillator model. The films studied include acrylics, fluoropolymers, and variations,of polyethylene, polystyrene, and polyvinyl chloride (PVC) among others. We are able to determine in-plane and out-of-plane optical constants. Transmission spectra from FTIR measurements are plotted and compared with ellipsometry results.

    Journal Title

    International Journal of Infrared and Millimeter Waves

    Volume

    27

    Issue/Number

    11

    Publication Date

    1-1-2006

    Document Type

    Article

    Language

    English

    First Page

    1553

    Last Page

    1571

    WOS Identifier

    WOS:000243227200010

    ISSN

    0195-9271

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