TCAD methodology for design of SCR devices for electrostatic discharge (ESD) applications
Abbreviated Journal Title
IEEE Trans. Electron Devices
blocking junction; computer-aided design; electrostatic discharge (ESD); silicon-controlled. rectifier (SCR); trigger voltage; PROTECTION TECHNIQUES; MOBILITY MODEL; SIMULATION; Engineering, Electrical & Electronic; Physics, Applied
Realization of on-chip electrostatic discharge (ESD) protection requires extensive technical experience and know-how. A technology computer-aided design (TCAD) methodology aimed to assist in the design and implementation of robust ESD devices is developed and presented. The methodology provides a systematic and practical means for the evaluation and optimization.of ESD devices in a simulation environment. Advanced siliconcontrolled-rectifier devices are considered to illustrate the approach, and experimental data measured from these devices are also included in support of the TCAD development.
Ieee Transactions on Electron Devices
"TCAD methodology for design of SCR devices for electrostatic discharge (ESD) applications" (2007). Faculty Bibliography 2000s. 7605.