Title

TCAD methodology for design of SCR devices for electrostatic discharge (ESD) applications

Authors

Authors

J. A. Salcedo; J. J. Liou; Z. W. Liu;J. E. Vinson

Comments

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Abbreviated Journal Title

IEEE Trans. Electron Devices

Keywords

blocking junction; computer-aided design; electrostatic discharge (ESD); silicon-controlled. rectifier (SCR); trigger voltage; PROTECTION TECHNIQUES; MOBILITY MODEL; SIMULATION; Engineering, Electrical & Electronic; Physics, Applied

Abstract

Realization of on-chip electrostatic discharge (ESD) protection requires extensive technical experience and know-how. A technology computer-aided design (TCAD) methodology aimed to assist in the design and implementation of robust ESD devices is developed and presented. The methodology provides a systematic and practical means for the evaluation and optimization.of ESD devices in a simulation environment. Advanced siliconcontrolled-rectifier devices are considered to illustrate the approach, and experimental data measured from these devices are also included in support of the TCAD development.

Journal Title

Ieee Transactions on Electron Devices

Volume

54

Issue/Number

4

Publication Date

1-1-2007

Document Type

Article

Language

English

First Page

822

Last Page

832

WOS Identifier

WOS:000245327900026

ISSN

0018-9383

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