Title

Optical-force-induced artifacts in scanning probe microscopy

Authors

Authors

D. C. Kohlgraf-Owens; S. Sukhov;A. Dogariu

Comments

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Abbreviated Journal Title

Opt. Lett.

Keywords

RESOLUTION; MODE; Optics

Abstract

In the practice of near-field scanning probe microscopy, it is typically assumed that the distance regulation is independent of the optical signal. However, we demonstrate that these two signals are entangled due to the inherent action of optically induced force. This coupling leads to artifacts in both estimating the magnitude of optical fields and recording topographic maps. (C) 2011 Optical Society of America

Journal Title

Optics Letters

Volume

36

Issue/Number

24

Publication Date

1-1-2011

Document Type

Article

Language

English

First Page

4758

Last Page

4760

WOS Identifier

WOS:000298378200013

ISSN

0146-9592

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