Optical-force-induced artifacts in scanning probe microscopy

    Authors

    D. C. Kohlgraf-Owens; S. Sukhov;A. Dogariu

    Comments

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    Abbreviated Journal Title

    Opt. Lett.

    Keywords

    RESOLUTION; MODE; Optics

    Abstract

    In the practice of near-field scanning probe microscopy, it is typically assumed that the distance regulation is independent of the optical signal. However, we demonstrate that these two signals are entangled due to the inherent action of optically induced force. This coupling leads to artifacts in both estimating the magnitude of optical fields and recording topographic maps. (C) 2011 Optical Society of America

    Journal Title

    Optics Letters

    Volume

    36

    Issue/Number

    24

    Publication Date

    1-1-2011

    Document Type

    Article

    Language

    English

    First Page

    4758

    Last Page

    4760

    WOS Identifier

    WOS:000298378200013

    ISSN

    0146-9592

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