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Abbreviated Journal Title

Phys. Rev. B

Keywords

Physics; Condensed Matter

Abstract

Fractal formation has been observed after thermal annealing of the rf-sputtered Y-Ba-Cu-O thin film on SrTiO3 substrate. Through energy-dispersive x-ray analysis, it was found that the composition of the fractal was YBa2Cu3Ox and the surrounding film composition was Y2Ba2Cu3Ox. The fractal dimensions D ranging from 1.26 to 1.65 were obtained using the standard sandbox method with different thresholds.

Journal Title

Physical Review B

Volume

40

Issue/Number

4

Publication Date

1-1-1989

Document Type

Note

Language

English

First Page

2627

Last Page

2630

WOS Identifier

WOS:A1989AJ23700098

ISSN

0163-1829

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