Abbreviated Journal Title
Phys. Rev. B
Physics; Condensed Matter
Fractal formation has been observed after thermal annealing of the rf-sputtered Y-Ba-Cu-O thin film on SrTiO3 substrate. Through energy-dispersive x-ray analysis, it was found that the composition of the fractal was YBa2Cu3Ox and the surrounding film composition was Y2Ba2Cu3Ox. The fractal dimensions D ranging from 1.26 to 1.65 were obtained using the standard sandbox method with different thresholds.
Physical Review B
Chow, L.; Chen, J.; Desai, V.; Sundaram, K.; and Arora, S., "Fractal Formation Of A Y-Ba-Cu-O Thin-Film On Srtio3" (1989). Faculty Bibliography 1980s. 756.