Title

Life Distributions And Degradation For A 2-Out-Of-N-F System

Comments

Authors: contact us about adding a copy of your work at STARS@ucf.edu

Abbreviated Journal Title

IEEE Trans. Reliab.

Keywords

Computer Science; Hardware & Architecture; Computer Science; Software; Engineering; Engineering; Electrical & Electronic

Journal Title

IEEE Transactions on Reliability

Volume

30

Issue/Number

1

Publication Date

1-1-1981

Document Type

Article

Language

English

First Page

82

Last Page

84

WOS Identifier

WOS:A1981LQ78000032

ISSN

0018-9529

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