Sensitive Measurement of Optical Nonlinearities Using a Single Beam

    Authors

    M. Sheikbahae; A. A. Said; T. H. Wei; D. J. Hagan;E. W. Vanstryland

    Comments

    Authors: contact us about adding a copy of your work at STARS@ucf.edu

    Keywords

    Engineering, Electrical & Electronic; Optics; Physics, Applied

    Journal Title

    IEEE Journal of Quantum Electronics

    Volume

    26

    Issue/Number

    4

    Publication Date

    1-1-1990

    Document Type

    Article

    Language

    English

    First Page

    760

    Last Page

    769

    WOS Identifier

    WOS:A1990DM16100020

    ISSN

    0018-9197

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