Modulation-Transfer-Function-Enhanced Readout For Sprite Detectors

    Authors

    F. J. Effenberger;G. D. Boreman

    Comments

    Authors: contact us about adding a copy of your work at STARS@ucf.edu

    Abbreviated Journal Title

    Appl. Optics

    Keywords

    SPRITE; silicon; readout; testing; infrared; detector; Optics

    Abstract

    A new readout structure is investigated for signal-processing-in-the-element detectors that yields a modulation transfer function that is 3.5 dB better than those currently used. Experimental verification is performed in Si rather than HgCdTe, with similarity relations derived for the two semiconductors.

    Journal Title

    Applied Optics

    Volume

    35

    Issue/Number

    7

    Publication Date

    1-1-1996

    Document Type

    Article

    Language

    English

    First Page

    1022

    Last Page

    1024

    WOS Identifier

    WOS:A1996UA05800003

    ISSN

    0003-6935

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