Z Scan Using Circularly Symmetric Beams

    Authors

    B. K. Rhee; J. S. Byun;E. W. VanStryland

    Comments

    Authors: contact us about adding a copy of your work at STARS@ucf.edu

    Abbreviated Journal Title

    J. Opt. Soc. Am. B-Opt. Phys.

    Keywords

    SINGLE-BEAM; Optics

    Abstract

    We report general characteristics of on-axis Z-scan transmittance for arbitrary circularly symmetric beams. Some experimental results are presented for a nearly top-hat-shaped beam and for a trimmed Airy beam whose electric field profile is the central portion of an Airy function inside its first zero. The sensitivity of Z-scan method with a Brimmed Airy beam for measuring an induced index-of-refraction change is a factor of 1.5 greater than that of a Gaussian beam. Also, it is found that there are some advantages of experimental alignment and numerical convergence for a Z-scan measurement that uses a trimmed Airy beam over one that uses a top-hat beam. (C) 1996 Optical Society of America.

    Journal Title

    Journal of the Optical Society of America B-Optical Physics

    Volume

    13

    Issue/Number

    12

    Publication Date

    1-1-1996

    Document Type

    Article

    Language

    English

    First Page

    2720

    Last Page

    2423

    WOS Identifier

    WOS:A1996WA57200006

    ISSN

    0740-3224

    Share

    COinS