Title

Z Scan Using Circularly Symmetric Beams

Authors

Authors

B. K. Rhee; J. S. Byun;E. W. VanStryland

Comments

Authors: contact us about adding a copy of your work at STARS@ucf.edu

Abbreviated Journal Title

J. Opt. Soc. Am. B-Opt. Phys.

Keywords

SINGLE-BEAM; Optics

Abstract

We report general characteristics of on-axis Z-scan transmittance for arbitrary circularly symmetric beams. Some experimental results are presented for a nearly top-hat-shaped beam and for a trimmed Airy beam whose electric field profile is the central portion of an Airy function inside its first zero. The sensitivity of Z-scan method with a Brimmed Airy beam for measuring an induced index-of-refraction change is a factor of 1.5 greater than that of a Gaussian beam. Also, it is found that there are some advantages of experimental alignment and numerical convergence for a Z-scan measurement that uses a trimmed Airy beam over one that uses a top-hat beam. (C) 1996 Optical Society of America.

Journal Title

Journal of the Optical Society of America B-Optical Physics

Volume

13

Issue/Number

12

Publication Date

1-1-1996

Document Type

Article

Language

English

First Page

2720

Last Page

2423

WOS Identifier

WOS:A1996WA57200006

ISSN

0740-3224

Share

COinS