An Improved Junction Field-Effect Transistor Static Model For Integrated-Circuit Simulation

    Authors

    W. W. Wong; J. J. Liou;J. Prentice

    Comments

    Authors: contact us about adding a copy of your work at STARS@ucf.edu

    Abbreviated Journal Title

    IEEE Trans. Electron Devices

    Keywords

    Engineering, Electrical & Electronic; Physics, Applied

    Journal Title

    Ieee Transactions on Electron Devices

    Volume

    37

    Issue/Number

    7

    Publication Date

    1-1-1990

    Document Type

    Note

    Language

    English

    First Page

    177

    Last Page

    1775

    WOS Identifier

    WOS:A1990DK33200023

    ISSN

    0018-9383

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