Fractal roughness retrieval by integrated wavelet transform

    Authors

    A. Dogariu; G. Boreman; J. Uozumi;T. Asakura

    Comments

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    Abbreviated Journal Title

    Opt. Rev.

    Keywords

    integrated wavelet transform; rough surface; fractal surface; self-similar surface; self-affine surface; autocorrelation; scaling; exponent; X-RAY-SCATTERING; SURFACE; SEA; Optics

    Abstract

    An integrated-wavelet-transform (IWT) approach is proposed for the study of scattering from slightly rough surfaces that manifest scaling properties over a finite domain of correlation lengths. Instead of collecting angle-resolved intensities, values of the irradiance integrated over increasing areas are used to enhance the contributions of small irradiances at large scattering angles and to reduce the coherent noise. In the case of self-similar surfaces, the scaling behavior of IWT allows investigation of the surface roughness at various length scales. For the realistic case of self-affine surfaces, IWT permits the evaluation of the scaling exponent of the autocorrelation and also offers a direct way to evaluate the necessary length scale of the surface profile.

    Journal Title

    Optical Review

    Volume

    6

    Issue/Number

    4

    Publication Date

    1-1-1999

    Document Type

    Article

    Language

    English

    First Page

    293

    Last Page

    301

    WOS Identifier

    WOS:000083301300004

    ISSN

    1340-6000

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