Using repair-depot system reliability to determine the distribution of supportability turn-around time

    Authors

    D. G. Linton;W. Dou

    Comments

    Authors: contact us about adding a copy of your work at STARS@ucf.edu

    Abbreviated Journal Title

    IEEE Trans. Reliab.

    Keywords

    reliability assurance; supportability turnaround time; downstream repair; completion time; scheduling repair start-times; numerical analysis; root-finding under uncertainty; POLICIES; Computer Science, Hardware & Architecture; Computer Science, Software; Engineering; Engineering, Electrical & Electronic

    Abstract

    assuming constant repair times, Linton, et al. (1995) used an 'expression for the reliability of the system for repairing failed units (FU) at a repair-depot' to compute the longest repair time for a newly failed unit (NFU) which assures a given reliability level (also termed the NFU supportability turn-around time, STAT) in terms of the: constant failure rate for all components, number of spares (s) on-hand, number (n) of FU either 'under repair' or 'scheduled to begin repair in the future', downstream repair completion times (DRCT) for FU. Since subtraction of the repair time for a NFU from its STAT-value yields the NFU's latest repair start-time (LRST) which assures a given repair-depot system reliability (RDSR), STAT-values are important for scheduling RST. This paper assumes that repair time is a random variable and, consequently, DRCT is a random variable. As shown in Linton, et al, (1995), STAT is the zero of a nonlinear, non-polynomial function of DRCT; thus, STAT is also a random variable, and determining the distribution of STAT is a stochastic root-finding problem. For n = 1 and s greater than or equal to 0, numerical analysis and probability theory are used to find the Cdf and pdf of STAT in terms of any repair time pdf Using the pdf's for STAT and repair time, expressions are derived for E{LRST} for a NFU, q = Pr {(repair time + c) < STAT}, c = 0 and c =E{LRST}. When the repair time Cdf is exponential or 2-Erlang, numerical values are obtained for q and E(LRST), and it is shown how these values may be used by depot management to schedule RST for a NFU.

    Journal Title

    Ieee Transactions on Reliability

    Volume

    48

    Issue/Number

    4

    Publication Date

    1-1-1999

    Document Type

    Article

    Language

    English

    First Page

    388

    Last Page

    393

    WOS Identifier

    WOS:000084613200010

    ISSN

    0018-9529

    Share

    COinS