Abbreviated Journal Title
Appl. Phys. Lett.
Keywords
Optical Nonlinearities; Wave-Guides; Transmission; Absorption; Physics; Applied
Abstract
Z-scan at 1064 nm was used with single, 35 ps pulses to measure the nonlinear refraction and absorption in single crystal PTS (p-toluene sulfonate). Detailed analysis of the Z-scan data based on DELTAn = n2I + n3I2 and DELTAalpha = alpha2I + alpha3I2 yielded n2 = 5(+/-1) X 10(-12) cm2/W, alpha2 = 100(+/-20) cm/GW, n3 = 5(+/-1)X 10(-21) cm4/W2 and alpha3 = - 5 (+/- 1) cm3/GW.2 The resulting two photon figure of merit T for PTS is marginal for high throughput, all-optical waveguide switching at 1064 nm.
Journal Title
Applied Physics Letters
Volume
64
Issue/Number
21
Publication Date
1-1-1994
Document Type
Article
DOI Link
Language
English
First Page
2773
Last Page
2775
WOS Identifier
ISSN
0003-6951
Recommended Citation
Lawrence, Brian L.; Cha, Myoungsik; Torruellas, William E.; Stegeman, George I.; Etemad, Shahab; Baker, Gregory; and Kajzar, François, "Measurement Of The Complex Nonlinear Refractive-Index Of Single-Crystal P-Toluene Sulfonate At 1064-Nm" (1994). Faculty Bibliography 1990s. 2958.
https://stars.library.ucf.edu/facultybib1990/2958
Comments
Authors: contact us about adding a copy of your work at STARS@ucf.edu
"This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in the linked citation and may be found originally at Applied Physics Letters."