Title

Near-Infrared Raman-Spectroscopy Using Ccd Detection And A Semiconductor Bandgap Filter For Rayleigh Line Rejection

Authors

Authors

A. Schulte

Comments

Authors: contact us about adding a copy of your work at STARS@ucf.edu

Abbreviated Journal Title

Appl. Spectrosc.

Keywords

Instrumentation, Ccd; Lasers, Ti Sapphire; Raman Spectroscopy; Instruments & Instrumentation; Spectroscopy

Abstract

A novel application of a tuneable Ti:sapphire laser and a CdTe Rayleigh line rejection filter for near-infrared Raman spectroscopy employing a single grating spectrograph and multichannel detection is demonstrated. Raman spectra of liquid, solid, and photobiological samples have been measured within 75 cm-1 of the exciting laser line. At excitation wavelengths between 790 and 850 nm, a significant improvement in sensitivity over that for present Fourier transform Raman techniques has been obtained.

Journal Title

Applied Spectroscopy

Volume

46

Issue/Number

6

Publication Date

1-1-1992

Document Type

Note

DOI Link

http://dx.doi.org/10.1366/0003702924124312

Language

English

First Page

891

Last Page

893

WOS Identifier

WOS:A1992HZ91500001

ISSN

0003-7028

Recommended Citation

"Near-Infrared Raman-Spectroscopy Using Ccd Detection And A Semiconductor Bandgap Filter For Rayleigh Line Rejection" (1992). Faculty Bibliography 1990s. 570.
https://stars.library.ucf.edu/facultybib1990/570