Near-Infrared Raman-Spectroscopy Using Ccd Detection And A Semiconductor Bandgap Filter For Rayleigh Line Rejection

    Authors

    A. Schulte

    Comments

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    Abbreviated Journal Title

    Appl. Spectrosc.

    Keywords

    Instrumentation, Ccd; Lasers, Ti Sapphire; Raman Spectroscopy; Instruments & Instrumentation; Spectroscopy

    Abstract

    A novel application of a tuneable Ti:sapphire laser and a CdTe Rayleigh line rejection filter for near-infrared Raman spectroscopy employing a single grating spectrograph and multichannel detection is demonstrated. Raman spectra of liquid, solid, and photobiological samples have been measured within 75 cm-1 of the exciting laser line. At excitation wavelengths between 790 and 850 nm, a significant improvement in sensitivity over that for present Fourier transform Raman techniques has been obtained.

    Journal Title

    Applied Spectroscopy

    Volume

    46

    Issue/Number

    6

    Publication Date

    1-1-1992

    Document Type

    Note

    Language

    English

    First Page

    891

    Last Page

    893

    WOS Identifier

    WOS:A1992HZ91500001

    ISSN

    0003-7028

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