Critical-Field Patterns In Optical Fibonacci Multilayers

Authors

    Authors

    L. Chow;K. H. Guenther

    Comments

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    Abbreviated Journal Title

    J. Opt. Soc. Am. A-Opt. Image Sci. Vis.

    Keywords

    Acoustic-Waves; Localization; Dense; Light; Optics

    Abstract

    Optical coatings with 13, 34, 55, and 89 quarter-wave layers of high- and low-index dielectric materials arranged in Fibonacci sequences F6, F8, F9, and F10, respectively, were deposited with use of a reactive low-voltage ion plating process. The calculated average transmission (T(ave)) for phi = (1/2 +/- 1/4)pi follows a power law T(ave) almost-equal-to N(m)-delta, where N(m) is the number of optical quarter-wave layers in a Fibonacci sequence F(m). The critical exponent delta for these multilayers is compared with a renormalization calculation of the exponent governing the total energy width for an electronic system of Fibonacci layers. Spectral-transmittance measurements of the experimental Fibonacci multilayers show some deviation from the calculated spectral transmittance, which is due primarily to absorption in the short-wavelength range, but these measurements do still indicate that the observed optical field patterns are critical.

    Journal Title

    Journal of the Optical Society of America a-Optics Image Science and Vision

    Volume

    10

    Issue/Number

    10

    Publication Date

    1-1-1993

    Document Type

    Article

    Language

    English

    First Page

    2231

    Last Page

    2235

    WOS Identifier

    WOS:A1993LZ15700013

    ISSN

    0740-3232

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