Z-Scan Measurements Of The Anisotropy Of Nonlinear Refraction And Absorption In Crystals

    Authors

    R. Desalvo; M. Sheikbahae; A. A. Said; D. J. Hagan;E. W. Vanstryland

    Comments

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    Abbreviated Journal Title

    Opt. Lett.

    Keywords

    2-Photon Absorption; Semiconductors; Index; Gaas; Optics

    Abstract

    We introduce a method for measuring the anisotropy of nonlinear absorption and nonlinear refraction in crystals by incorporating a wave plate into the Z-scan apparatus. We demonstrate this method by measuring the polarization dependence of the nonlinear refractive index or two-photon absorption coefficient in BaF2, KTP, and GaAs at wavelengths of 532 and 1064 nm.

    Journal Title

    Optics Letters

    Volume

    18

    Issue/Number

    3

    Publication Date

    1-1-1993

    Document Type

    Article

    Language

    English

    First Page

    194

    Last Page

    196

    WOS Identifier

    WOS:A1993KH45300006

    ISSN

    0146-9592

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