Characterization Of Nonlinear-Optical Absorption And Refraction

    Authors

    E. W. Vanstryland; M. Sheikbahae; A. A. Said;D. J. Hagan

    Comments

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    Abbreviated Journal Title

    Prog. Cryst. Growth Charact. Mater.

    Keywords

    2-Photon Absorption; N2 Measurements; Free-Carrier; Single-Beam; Semiconductors; Gaas; Dispersion; Crystals; Glasses; Index; Crystallography; Materials Science, Characterization & Testing

    Abstract

    We discuss the characterization of nonlinear optical processes that give rise to changes in the absorption coefficient and refractive index. We primarily concentrate on methods for determining the dominant nonlinearities present in condensed matter and the responsible physical mechanisms. In extensive studies of a wide variety of material, we have found that there is seldom a single nonlinear process occurring. Often several processes occur simultaneously, sometimes in unison, sometimes competing. It is necessary to experimentally distinguish and separate these processes in order to understand and model the interaction. There are a variety of methods and techniques for determining the nonlinear optical response, each with its own weaknesses and advantages. In general, it is advisable to use as many complementary techniques as possible over a broad spectral range in order to unambiguously determine the active nonlinearities. Here we concentrate on the use of nonlinear transmittance, Z-scan and degenerate four-wave mixing experiments as applied to polycrystalline and single crystal semiconductors and dielectric materials.

    Journal Title

    Progress in Crystal Growth and Characterization of Materials

    Volume

    27

    Issue/Number

    3-4

    Publication Date

    1-1-1993

    Document Type

    Review

    Language

    English

    First Page

    279

    Last Page

    311

    WOS Identifier

    WOS:A1993NR04900004

    ISSN

    0146-3535

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