The influence of periodicity on the structures and properties of annealed Fe/Pt (n) multilayer films

Authors

    Authors

    B. Yao;K. R. Coffey

    Comments

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    Abbreviated Journal Title

    J. Magn. Magn. Mater.

    Keywords

    Fe/Pt multilayer film; reaction; period; annular dark field image; FE/PT MULTILAYERS; THIN-FILMS; MAGNETIC-PROPERTIES; FE-PT; TEMPERATURE; COPT; Materials Science, Multidisciplinary; Physics, Condensed Matter

    Abstract

    The heat treatment of [Fe/Pt](n) multilayer films is a promising approach to form the L1(0) FePt phase at a reduced temperature, which is of interest for applications as high-density magnetic recording media and high-energy permanent magnets. This paper reports the influence of the bilayer period in the range of 1-18nm on the microstructure and magnetic properties of annealed polycrystalline [Fe/Pt](n) films sputtered onto thermally oxidized Si substrates. The microstructures were characterized by transmission electron microscopy and dynamical conical annular dark field imaging was used to identify the L1(0) phase grains present in the sample. This ordered phase was only observed in samples annealed at or above 300 degrees C and was found to have a typical grain size smaller than that of the mostly A1 (fcc) matrix. The majority of the L1(0) grains were relatively small and located at boundaries between larger grains. Measurements of c/a ratio of the L1(0) phase indicated an increase in the degree of chemical ordering with as-deposited film period. We also found the coercivity of the annealed polycrystalline multilayer films to increase with the as-deposited period, which is contrary to previous reports in which epitaxial [Fe/Pt](n) films were studied. (c) 2007 Elsevier B.V. All rights reserved.

    Journal Title

    Journal of Magnetism and Magnetic Materials

    Volume

    320

    Issue/Number

    3-4

    Publication Date

    1-1-2008

    Document Type

    Article

    Language

    English

    First Page

    559

    Last Page

    564

    WOS Identifier

    WOS:000251549100077

    ISSN

    0304-8853

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