Hot-carrier reliability and breakdown characteristics of multi-finger RF MOS transistors

    Authors

    H. Wong; Y. Fu; J. J. Liou;Y. Yue

    Abstract

    Hot-carrier reliability and drain breakdown characteristics of multi-finger short channel MOS transistors are studied in derail. Several abnormal characteristics were observed. With the aid of numerical simulation, we found that the shared drain and source regions for adjacent gate fingers can lead to current crowding and result in the finger number-dependent current-voltage characteristics. In addition, the high current density spots near the drain region would result in the significant hot-carrier induced transconductance degradation as well as remarkable drain breakdown voltage lowering. (C) 2008 Elsevier Ltd. All rights reserved.

    Journal Title

    Microelectronics Reliability

    Volume

    49

    Issue/Number

    1

    Publication Date

    1-1-2009

    Document Type

    Article

    First Page

    13

    Last Page

    16

    WOS Identifier

    WOS:000263208400003

    ISSN

    0026-2714

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