Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast X-ray diffraction

    Authors

    K. Sokolowski-Tinten; M. H. von Hoegen; D. von der Linde; A. Cavalleri; C. W. Siders; F. L. H. Brown; D. M. Leitner; C. Toth; J. A. Squier; C. P. J. Bart; K. R. Wilson;M. Kammler

    Comments

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    Abbreviated Journal Title

    J. Phys. IV

    Keywords

    Physics, Multidisciplinary

    Abstract

    Using time-resolved x-ray diffraction ultafast lattice dynamics in fs-laser-excited crystalline bulk Ge and Ge/Si-heterostructures has been studied. This experimental technique uniquely allows us to observe fast energy transport deep into. the bulk of the material, coherent acoustic phonon dynamics, lattice anharmonicity, and vibrational transport across a buried interface.

    Journal Title

    Journal De Physique Iv

    Volume

    11

    Issue/Number

    PR2

    Publication Date

    1-1-2001

    Document Type

    Article; Proceedings Paper

    Language

    English

    First Page

    473

    Last Page

    477

    WOS Identifier

    WOS:000171208500092

    ISSN

    1155-4339

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