Title

Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast X-ray diffraction

Authors

Authors

K. Sokolowski-Tinten; M. H. von Hoegen; D. von der Linde; A. Cavalleri; C. W. Siders; F. L. H. Brown; D. M. Leitner; C. Toth; J. A. Squier; C. P. J. Bart; K. R. Wilson;M. Kammler

Comments

Authors: contact us about adding a copy of your work at STARS@ucf.edu

Abbreviated Journal Title

J. Phys. IV

Keywords

Physics, Multidisciplinary

Abstract

Using time-resolved x-ray diffraction ultafast lattice dynamics in fs-laser-excited crystalline bulk Ge and Ge/Si-heterostructures has been studied. This experimental technique uniquely allows us to observe fast energy transport deep into. the bulk of the material, coherent acoustic phonon dynamics, lattice anharmonicity, and vibrational transport across a buried interface.

Journal Title

Journal De Physique Iv

Volume

11

Issue/Number

PR2

Publication Date

1-1-2001

Document Type

Article; Proceedings Paper

DOI Link

http://dx.doi.org/10.1051/jp4:2001290

Language

English

First Page

473

Last Page

477

WOS Identifier

WOS:000171208500092

ISSN

1155-4339

Recommended Citation

"Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast X-ray diffraction" (2001). Faculty Bibliography 2000s. 2959.
https://stars.library.ucf.edu/facultybib2000/2959