Off-diagonal Mueller matrix elements in backscattering from highly diffusive media

    Authors

    J. Ellis; P. Caillard;A. Dogariu

    Abbreviated Journal Title

    J. Opt. Soc. Am. A-Opt. Image Sci. Vis.

    Keywords

    TARGET DETECTION; RANDOMLY ROUGH; POLARIZATION; SCATTERING; DEPOLARIZATION; SURFACES; Optics

    Abstract

    Measurements of a reduced Mueller matrix in backscattering from highly diffusive, dielectric samples are reported as a function of the angle of incidence. It was found that the off-diagonal terms depend greatly on the angle of incidence, increasing to a maximum near grazing incidence. We show that, despite a significant scattering originating in the bulk of such diffusive media, the nontrivial behavior of the off-diagonal Muller matrix is primarily due to surface scattering phenomena. The experimental data can be simply explained by assuming a random orientation of small particles and considering only double scattering in the plane of the surface. (C) 2002 Optical Society of America.

    Journal Title

    Journal of the Optical Society of America a-Optics Image Science and Vision

    Volume

    19

    Issue/Number

    1

    Publication Date

    1-1-2002

    Document Type

    Article

    Language

    English

    First Page

    43

    Last Page

    48

    WOS Identifier

    WOS:000172930600006

    ISSN

    0740-3232

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