Title

Implementation of a comprehensive and robust MOSITET model in cadence SPICE for ESD applications

Authors

Authors

X. F. Gao; J. J. Liou; J. Bernier; G. Croft;A. Ortiz-Conde

Abbreviated Journal Title

IEEE Trans. Comput-Aided Des. Integr. Circuits Syst.

Keywords

electrostatic discharge; modeling; MOSFET; SPICE; ELECTROSTATIC DISCHARGE; SEMICONDUCTOR-DEVICES; BREAKDOWN; Computer Science, Hardware & Architecture; Computer Science, ; Interdisciplinary Applications; Engineering, Electrical & Electronic

Abstract

Electrostatic discharge (ESD) is a critical reliability concern for microchips. This paper presents a comprehensive computer-aided design tool for ESD applications. Specifically, the authors develop an improved and robust MOS model and implement such a model into the industry standard Cadence SPICE for ESD circuit simulation. The key components relevant to ESD in the MOS model are studied and the implementation procedure is discussed. Experimental data measured from the human body model tester are included in support of the model.

Journal Title

Ieee Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volume

21

Issue/Number

12

Publication Date

1-1-2002

Document Type

Article

Language

English

First Page

1497

Last Page

1502

WOS Identifier

WOS:000179708700011

ISSN

0278-0070

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