Micro-electro-mechanical system-based digitally controlled optical beam profiler

    Authors

    S. Sumriddetchkajorn;N. A. Riza

    Comments

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    Abbreviated Journal Title

    Appl. Optics

    Keywords

    LASER-BEAM; Optics

    Abstract

    An optical beam profiler is introduced that uses a two-dimensional (2-D) small-tilt micromirror device. Its key features include fast speed, digital control, low polarization sensitivity, and wavelength independence. The use of this 2-D multipixel device opens up the important possibility of realizing several beam profile measurement concepts, such as a moving knife edge, a scanning slit, a moving pinhole, a variable aperture, and a 2-D photodiode array. The experimental proof of the optical beam profiler concept using a 2-D digital micromirror device to simulate the 2-D moving knife edge indicates a small measurement error of 0.19% compared with the expected number based on a Gaussian beam-propagation analysis. Other 2-D pixel arrays such as a liquid-crystal-based 90degrees polarization rotator sandwiched between crossed polarizers can also be exploited for the optical beam whose polarization direction is known. (C) 2002 Optical Society of America.

    Journal Title

    Applied Optics

    Volume

    41

    Issue/Number

    18

    Publication Date

    1-1-2002

    Document Type

    Article

    Language

    English

    First Page

    3506

    Last Page

    3510

    WOS Identifier

    WOS:000176274200002

    ISSN

    1559-128X

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