Title

Micro-electro-mechanical system-based digitally controlled optical beam profiler

Authors

Authors

S. Sumriddetchkajorn;N. A. Riza

Comments

Authors: contact us about adding a copy of your work at STARS@ucf.edu

Abbreviated Journal Title

Appl. Optics

Keywords

LASER-BEAM; Optics

Abstract

An optical beam profiler is introduced that uses a two-dimensional (2-D) small-tilt micromirror device. Its key features include fast speed, digital control, low polarization sensitivity, and wavelength independence. The use of this 2-D multipixel device opens up the important possibility of realizing several beam profile measurement concepts, such as a moving knife edge, a scanning slit, a moving pinhole, a variable aperture, and a 2-D photodiode array. The experimental proof of the optical beam profiler concept using a 2-D digital micromirror device to simulate the 2-D moving knife edge indicates a small measurement error of 0.19% compared with the expected number based on a Gaussian beam-propagation analysis. Other 2-D pixel arrays such as a liquid-crystal-based 90degrees polarization rotator sandwiched between crossed polarizers can also be exploited for the optical beam whose polarization direction is known. (C) 2002 Optical Society of America.

Journal Title

Applied Optics

Volume

41

Issue/Number

18

Publication Date

1-1-2002

Document Type

Article

Language

English

First Page

3506

Last Page

3510

WOS Identifier

WOS:000176274200002

ISSN

1559-128X

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