Title

Refractive index measurements of planar chalcogenide thin film

Authors

Authors

J. M. Laniel; J. M. Menard; K. Turcotte; A. Villeneuve; R. Vallee; C. Lopez;K. A. Richardson

Comments

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Abbreviated Journal Title

J. Non-Cryst. Solids

Keywords

OPTICAL-PROPERTIES; WAVE-GUIDES; GLASSES; Materials Science, Ceramics; Materials Science, Multidisciplinary

Abstract

We report on the measurements of the refractive index of As-S-Se chalcogenide glasses near 1.55 mum. The measurements were made on annealed and non-annealed samples of thermally evaporated thin films. The data for two different series of glasses are presented: the compositions As40S60-xSex and the compositions AsxS(100-x)/2Se(100-x)/2 where the ratio of sulfur to selenium is kept constant (1:1). It has been found that replacing sulfur by selenium in the first series increases the refractive index from 2.4 to 2.8 and increasing the arsenic content in the second series increases the refractive index, In all cases, it has been found that annealing the samples increase the refractive index. The accuracy in the refractive index measurement is +/-0.2%. (C) 2003 Elsevier B.V. All rights reserved.

Journal Title

Journal of Non-Crystalline Solids

Volume

328

Issue/Number

1-3

Publication Date

1-1-2003

Document Type

Article

DOI Link

http://dx.doi.org/10.1016/s0022-3093(03)00527-1

Language

English

First Page

183

Last Page

191

WOS Identifier

WOS:000186079300016

ISSN

0022-3093

Recommended Citation

"Refractive index measurements of planar chalcogenide thin film" (2003). Faculty Bibliography 2000s. 3874.
https://stars.library.ucf.edu/facultybib2000/3874