Title

The NBUT class of life distributions

Authors

Authors

I. A. Ahmad; M. Kayid;X. H. Li

Comments

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Abbreviated Journal Title

IEEE Trans. Reliab.

Keywords

increasing concave order; k out-of-n systems; life testing; mixing; random minima; series system; stochastic order; TTT transform order; OF-N SYSTEMS; STOCHASTIC ORDERS; PARALLEL SYSTEMS; MOMENTS INEQUALITIES; TESTING APPLICATIONS; CLOSURE PROPERTY; AGING PROPERTIES; RESIDUAL LIFE; RANDOM MINIMA; DMRL CLASSES; Computer Science, Hardware & Architecture; Computer Science, Software; Engineering; Engineering, Electrical & Electronic

Abstract

A new class of life distributions, namely new better than used in the total time on test transform ordering (NBUT), is introduced. The relationship of this class to other classes of life distributions, and closure properties under some reliability operations, are discussed. We provide a simple argument based on stochastic orders that the family of the NBUT distribution class is closed under the formation of series systems in case of independent identically distributed components. Behavior of this class is developed in terms of the monotonicity of the residual life of k-out-of-n systems given the time at which the (n - k)-th failure has occurred. Finally, we discuss testing exponentially against the NBUT aging property.

Journal Title

Ieee Transactions on Reliability

Volume

54

Issue/Number

3

Publication Date

1-1-2005

Document Type

Article

Language

English

First Page

396

Last Page

401

WOS Identifier

WOS:000231693400005

ISSN

0018-9529

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