The NBUT class of life distributions

    Authors

    I. A. Ahmad; M. Kayid;X. H. Li

    Comments

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    Abbreviated Journal Title

    IEEE Trans. Reliab.

    Keywords

    increasing concave order; k out-of-n systems; life testing; mixing; random minima; series system; stochastic order; TTT transform order; OF-N SYSTEMS; STOCHASTIC ORDERS; PARALLEL SYSTEMS; MOMENTS INEQUALITIES; TESTING APPLICATIONS; CLOSURE PROPERTY; AGING PROPERTIES; RESIDUAL LIFE; RANDOM MINIMA; DMRL CLASSES; Computer Science, Hardware & Architecture; Computer Science, Software; Engineering; Engineering, Electrical & Electronic

    Abstract

    A new class of life distributions, namely new better than used in the total time on test transform ordering (NBUT), is introduced. The relationship of this class to other classes of life distributions, and closure properties under some reliability operations, are discussed. We provide a simple argument based on stochastic orders that the family of the NBUT distribution class is closed under the formation of series systems in case of independent identically distributed components. Behavior of this class is developed in terms of the monotonicity of the residual life of k-out-of-n systems given the time at which the (n - k)-th failure has occurred. Finally, we discuss testing exponentially against the NBUT aging property.

    Journal Title

    Ieee Transactions on Reliability

    Volume

    54

    Issue/Number

    3

    Publication Date

    1-1-2005

    Document Type

    Article

    Language

    English

    First Page

    396

    Last Page

    401

    WOS Identifier

    WOS:000231693400005

    ISSN

    0018-9529

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