Focused-ion-beam assisted fabrication of individual multiwall carbon nanotube field emitter

    Authors

    G. Y. Chai; L. Chow; D. Zhou;S. R. Byahut

    Comments

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    Abbreviated Journal Title

    Carbon

    Keywords

    carbon nanotubes; focused-ion-beam; field emission; ELECTRON-EMISSION; BREAKDOWN; Chemistry, Physical; Materials Science, Multidisciplinary

    Abstract

    We report the fabrication of an individual carbon nanotube (CNT) electron field emitter using a focused-ion-beam (FIB) technique. The monolithic multiwall CNT with a graphitic shield is synthesized using chemical vapor deposition technique. The FIB technique is applied to attach the monolithic multiwall CNT on an etched tungsten tip. Field emission measurements arc carried out in a vacuum of 10(-7) Torr. Threshold voltage as low as 120 V has been obtained. (C) 2005 Elsevier Ltd. All rights reserved.

    Journal Title

    Carbon

    Volume

    43

    Issue/Number

    10

    Publication Date

    1-1-2005

    Document Type

    Article

    Language

    English

    First Page

    2083

    Last Page

    2087

    WOS Identifier

    WOS:000231167300006

    ISSN

    0008-6223

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