Title

Focused-ion-beam assisted fabrication of individual multiwall carbon nanotube field emitter

Authors

Authors

G. Y. Chai; L. Chow; D. Zhou;S. R. Byahut

Comments

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Abbreviated Journal Title

Carbon

Keywords

carbon nanotubes; focused-ion-beam; field emission; ELECTRON-EMISSION; BREAKDOWN; Chemistry, Physical; Materials Science, Multidisciplinary

Abstract

We report the fabrication of an individual carbon nanotube (CNT) electron field emitter using a focused-ion-beam (FIB) technique. The monolithic multiwall CNT with a graphitic shield is synthesized using chemical vapor deposition technique. The FIB technique is applied to attach the monolithic multiwall CNT on an etched tungsten tip. Field emission measurements arc carried out in a vacuum of 10(-7) Torr. Threshold voltage as low as 120 V has been obtained. (C) 2005 Elsevier Ltd. All rights reserved.

Journal Title

Carbon

Volume

43

Issue/Number

10

Publication Date

1-1-2005

Document Type

Article

Language

English

First Page

2083

Last Page

2087

WOS Identifier

WOS:000231167300006

ISSN

0008-6223

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